Applications of Finite Element Methods for Reliability Studies on ULSI Interconnections
von Cher Ming Tan, Yuejin Hou, Zhenghao Gan, Wei Li
2011 Gebunden, 160 Seiten, 241mm x 160mm x 14mm, Sprache(n): eng Gives readers a thorough understanding of the application of finite element methods to reliability modellingProvides various numerical models for interconnect reliabilityIncludes many illustrations to improve the reader's understan…
121,78 EUR
Applications of Finite Element Methods for Reliability Studies on ULSI Interconnections
von Cher Ming Tan, Yuejin Hou, Zhenghao Gan, Wei Li
2013 Kartoniert, 160 Seiten, 235mm x 155mm x 9mm, Sprache(n): eng Gives readers a thorough understanding of the application of finite element methods to reliability modelling Provides various numerical models for interconnect reliability Includes many illustrations to improve the reader's un…
121,78 EUR
- Autor
- Yuejin Hou
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