Metal-Dielectric Interfaces in Gigascale Electronics - Thermal and Electrical Stability
von Toh-Ming Lu, Ming He
2016 Kartoniert, 164 Seiten, 235mm x 155mm x 10mm, Sprache(n): eng Presents a unified approach to understanding the diverse phenomena observed at metal-dielectric interfaces Features fundamental considerations in the physics and chemistry of metal-dielectric interactions Explores mechanisms of…
121,78 EUR
Metal-Dielectric Interfaces in Gigascale Electronics - Thermal and Electrical Stability
von Toh-Ming Lu, Ming He
2011 Gebunden, 164 Seiten, 241mm x 160mm x 13mm, Sprache(n): eng Presents a unified approach to understanding the diverse phenomena observed at metal-dielectric interfacesFeatures fundamental considerations in the physics and chemistry of metal-dielectric interactionsExplores mechanisms of metal…
121,78 EUR
Metal-Dielectric Interfaces in Gigascale Electronics - Thermal and Electrical Stability
von Ming He Verlag: Springer US,
2012 2011. Neubindung, Buchschnitt leicht verkürzt, Buchecken und -rücken leicht angestoßen, Ausgabe 2012 11155406/12
- Sonderaktion: 10% Rabatt bis 04.07.2024
20,26 EUR
18,23 EUR
Evolution of Thin Film Morphology - Modeling and Simulations
von Toh-Ming Lu, Matthew Pelliccione
2010 Kartoniert, 220 Seiten, 235mm x 155mm x 13mm, Sprache(n): eng Presents basic modeling and simulation tools for quantitative description of thin film morphological evolution Displays clear conceptual developments in the fundamental understanding of complex surface growth phenomena Provides a…
182,67 EUR
Evolution of Thin Film Morphology
von Matthew Pelliccione Verlag: Springer US,
2008 2007. 297 x 210 mm 206 Seiten Ehemaliges Bibliotheksexemplar mit Stempel und Signatur. Moderate Gebrauchsspuren. Guter Zustand. 9780387751085
23,00 EUR
Pulsed and Pulsed Bias Sputtering - Principles and Applications
von Toh-Ming Lu, Edward V. Barnat
2014 Kartoniert, 172 Seiten, 235mm x 155mm x 10mm, Sprache(n): eng Diffusion Barrier Stack - 5 nm -3 nm -2 nm :. . . -. . . . : . . O. 21-lm Figure 2: Schematic representing a cross-sectional view of the topography that is encountered in the processing of integrated circuits. (Not to scale) thes…
121,78 EUR
Pulsed and Pulsed Bias Sputtering - Principles and Applications
von Toh-Ming Lu, Edward V. Barnat
2003 Gebunden, 180 Seiten, 241mm x 160mm x 15mm, Sprache(n): eng Diffusion Barrier Stack - 5 nm -3 nm -2 nm :. . . -. . . . : . . O. 21-lm Figure 2: Schematic representing a cross-sectional view of the topography that is encountered in the processing of integrated circuits. (Not to scale) these…
121,78 EUR
Chemical Vapor Deposition Polymerization - The Growth and Properties of Parylene Thin Films
von Toh-Ming Lu, Jeffrey B. Fortin
2003 Gebunden, 124 Seiten, 241mm x 160mm x 13mm, Sprache(n): eng Chemical Vapor Deposition Polymerization - The Growth and Properties of Parylene Thin Films is intended to be valuable to both users and researchers of parylene thin films. It should be particularly useful for those setting up and…
121,78 EUR
RHEED Transmission Mode and Pole Figures - Thin Film and Nanostructure Texture Analysis
von Toh-Ming Lu, Gwo-Ching Wang
2013 Gebunden, 240 Seiten, 241mm x 160mm x 19mm, Sprache(n): eng Presents a new application of RHEED in the transmission modeIntroduces a variety of textures from metals, semiconductors, compound semiconductors, and their characteristics in RHEED pole figuresProvides examples of RHEED measuremen…
121,78 EUR
RHEED Transmission Mode and Pole Figures - Thin Film and Nanostructure Texture Analysis
von Toh-Ming Lu, Gwo-Ching Wang
2016 Kartoniert, 240 Seiten, 235mm x 155mm x 14mm, Sprache(n): eng Presents a new application of RHEED in the transmission mode Introduces a variety of textures from metals, semiconductors, compound semiconductors, and their characteristics in RHEED pole figures Provides examples of RHEED meas…
121,78 EUR
- Autor
- Toh-Ming Lu
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