Dick de Ridder

F. van der Heijden, Laboratory for Measurement and Instrumentation, Faculty of Electrical Engineering, University of Twente, P.O. Box 217, 7500AE Enschede, The Netherlands His main research area is in Measurement and Instrumentation at an academic level and covers sensors and micro measurement systems, and image based measurement systems. He has written books, many book chapters and journal articles. R.P.W. Duin, Pattern Recognition Group, Delft University of Technology, Department of Imaging Sciences & Technology Lorentzeg 1-2628 CD Delft, The Netherlands His research includes: theory and applications of image processing and pattern recognition, with a special interest in sensors, measurements and measurement accuracy. He also studies the development and use of tools in this area. He has written 6 books (in English and Dutch) and many journal and conference papers and chapters in books. He is a member of Advanced School for Computing and Imaging (ASCI), Dutch Pattern Recognition Society (NVPHBV), International Association for Pattern Recognition (IAPR) and IAPR Technical Committee TC1 (statistical pattern recognition). D. de Ridder, Pattern Recognition Group, Delft University of Technology, Department of Imaging Sciences & Technology Lorentzeg 1-2628 CD Delft, The Netherlands He mainly works on methods for mapping high-dimensional measurement sets to low-dimensional representations, suitable for subsequent regression or classification. He works closely with R Duin and has co-written many papers with him. D.M.J. Tax, Fraunhofer FIRST.IDA, Kekul´estr. 7, D-12489, Berlin, Germany His main research interest is one-class classification. He was the author/co-author of many journal publications