David C. Joy
Autor von "Scanning Electron Microscopy and X-Ray Microanalysis", "Helium Ion Microscopy" und "Advanced Scanning Electron Microscopy and X-Ray Microanalysis" und weiteren Büchern.
This text is written by a team of authors associated with SEM and X-ray Microanalysis Courses presented as part of the Lehigh University Microscopy Summer School. Several of the authors have participated in this activity for more than 30 years.
Advanced Scanning Electron Microscopy and X-Ray Microanalysis
Softcover
erschienen am 08.06.2013
Scanning Electron Microscopy and X-Ray Microanalysis
Hardcover
erschienen am 31.01.2003
Scanning Electron Microscopy, X-Ray Microanalysis, and Analytica…
Softcover
erschienen am 31.08.1990
Advanced Scanning Electron Microscopy and X-Ray Microanalysis
Hardcover
erschienen am 31.03.1986