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Waseda, Yoshio; Matsubara, Eiichiro; Shinoda, Kozo

X-Ray Diffraction Crystallography Introduction, Examples and Solved Problems (Gebundene Ausgabe)

Springer-Verlag GmbH, Springer Berlin, März 2011

310 S. - Sprache: Englisch - 150 schwarz-weiße Abbildungen - 251x164x22 mm

ISBN: 3642166342 EAN: 9783642166341

X-ray diffraction crystallography for powder samples is a well-established and widely used method. It is applied to materials characterization to reveal the atomic scale structure of various substances in a variety of states. The book deals with fundamental properties of X-rays, geometry analysis of crystals, X-ray scattering and diffraction in polycrystalline samples and its application to the determination of the crystal structure. The reciprocal lattice and integrated diffraction intensity from crystals and symmetry analysis of crystals are explained. To learn the method of X-ray diffraction crystallography well and to be able to cope with the given subject, a certain number of exercises is presented in the book to calculate specific values for typical examples. This is particularly important for beginners in X-ray diffraction crystallography. One aim of this book is to offer guidance to solving the problems of 90 typical substances. For further convenience, 100 supplementary exercises are also provided with solutions. Some essential points with basic equations are summarized in each chapter, together with some relevant physical constants and the atomic scattering factors of the elements.

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Tutorial-like scientific monograph on X-ray diffraction analysisSummarizes the complete knowledge on X-Ray diffraction crystallography and structure analysis of crystals for researchers and graduate studentsPresents the crystallographic basics in a systematic way and fundamental properties of X-raysExcellent book for newcomers with 90 exercises and solutions + 90 problems


Fundamental Properties of X-rays.- Geometry of Crystals.- Scattering and Diffraction by Atoms and Crystals.- Diffraction from a Polycrystalline Sample and its Application to Determination of Crystal Structures.- Reciprocal Lattice and Integrated Intensity from Crystals.- Symmetry Analysis for Crystals and the Use of International Tables.- Solved Problems.


From the reviews:"The authors have developed their course lecture notes into a useful book that is suitable for graduate students of materials science and engineering who use X-ray diffraction techniques. ... This book is a very concise presentation of the theory of scattering and diffraction and the determination of crystal structures. ... The biggest strength of this book are the solutions that illustrate the quantitative aspects of the subject. The illustrations complement the text and there are many tables of real diffraction data and calculations of structures." (Barry R. Masters, Optics & Photonics News, April, 2012)

ISBN 3-642-16634-2

ISBN 978-3-642-16634-1

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